Keysight / Agilent 300 kHz - 20 GHz Vector Network Analyzer with Options 080 & 245 - CALIBRATED!

• 300 kHz to 6/13.5/20 GHz and 10 MHz to 20/40/50 GHz
• 2- or 4- ports with two built-in sources
• 110 dB system and 122 dB receiver dynamic range, 32,001 points, 32 channels
• < .006 dB rms (Option 22x)
• Measurement speed: 4 to 9 µs per point 

Capabilities of the Keysight (Agilent) N5230C:

• Mixer Measurements:
  • Conversion loss/gain, magnitude and phase
  • Input match, output match, and LO match
  • Isolation and compression
  • The two internal independent synthesizers with +13 dBm power and < 60 dBc harmonics eliminate the need for external synthesizers or components.
  • Advanced error correction
  • Patented vector-mixer calibration for measurement of absolute group delay
  • Scalar-mixer calibration (SMC) for match-corrected amplitude measurements
  • Signiicantly faster speed for ixed-IF (20 to 30 times faster than with an external source)
  • Easy-to-conigure multi-stage converter measurements
  • LO source control and LO power calibration
  • Mixer IMD
  • The simple two-step SMC calibration provides match-corrected conversion loss, error-corrected input and output match
  • Software tuning for embedded LO
• Amplifier Measurements:
  • Gain, gain latness, reverse isolation, and return loss
  • Simple, fast, and accurate AM-AM and AM-PM compression measurements with the Gain Compression Application with 38 dB power sweep range at 20 GHz, +13 dBm output power
  • Test harmonics accurately with < 60 dBc source harmonics. No need for external filters.
  • Accurate and simple IMD using the dual sources and internal combiner, located behind the couplers, providing highly accurate and stable measurements. No need for external combiners.
  • Source corrected noise igure measurements with exceptional accuracy
  • Integrated source attenuators and receiver attenuators for measurement optimization
  • Perform all of the above measurements with one single connection using the PNA–X.
• Pulsed-RF Measurements:
  • Wideband and narrowband detection
  • Up to four internal pulse generators
  • Up to two internal pulse modulators
  • Pulse widths as narrow as 33 ns
  • Pulse-to-pulse
  • Point-in-pulse, average pulse, and pulse-proile capability
  • No need for external components
• Basic Measurements:
  • Insertion loss, gain, return loss, isolation, group delay, compression, both magnitude and phase
  • Connectorized, in-fixture, or on-wafer
  • Fast and accurate
  • Reliable and repeatable
  • Affordable
• On-wafer Measurements:
  • Class of TRL calibrations for accurate measurements
  • Differential measurement capabilities with integrated multiport network analyzers
  • Accurate power control and de-embedding algorithm for device characterization
  • Compatibility with on-wafer calibration software for a total solution
• Differential Measurements:
  • Single-ended, balanced, mixed-mode
  • S-parameters
  • Ratioed and unratioed measurements
  • Mode-conversion analysis
  • True-mode stimulus measurements
• Multiport Measurements:
  • Multiport configurations optimized for your device, including full cross-bar
  • Quick-Short-Open-Load-Thru (QSOLT) for fast, multiport cal
  • N-port calibration for accuracy and ease-of-measurements
  • Test-set control part of PNA firmware
  • 32 independent channels for fast measurement speed